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 Neu: Silizium-PIN-Fotodiode New: Silicon PIN Photodiode
BP 104 S
Chip position
0...0.1 1.2 1.1 0.3
1.1 0.9
0.2 0.1
6.7 6.2 4.5 4.3 1.6 0.2
0.9 0.7
GEO06861
Mae in mm, wenn nicht anders angegeben/Dimensions in mm, unless otherwise specified.
Wesentliche Merkmale q Speziell geeignet fur Anwendungen im Bereich von 400 nm bis 1100 nm q Kurze Schaltzeit (typ. 20 ns) q geeignet fur Vapor-Phase Loten und IRReflow-Loten q SMT-fahig Anwendungen q Lichtschranken fur Gleich- und Wechsellichtbetrieb q IR-Fernsteuerungen q Industrieelektronik q "Messen/Steuern/Regeln"
Features q Especially suitable for applications from 400 nm to 1100 nm q Short switching time (typ. 20 ns) q Suitable for vapor-phase and IR-reflow soldering q Suitable for SMT Applications q Photointerrupters q IR remote controls q Industrial electronics q For control and drive circuits
Typ Type BP 104 S
Bestellnummer Ordering Code Q62702-P1605
Semiconductor Group
1
1997-11-19
feo06862
Photosensitive area 2.20 mm x 2.20 mm
Cathode lead
4.0 3.7
1.7 1.5
0...5
BP 104 S
Grenzwerte Maximum Ratings Bezeichnung Description Betriebs- und Lagertemperatur Operating and storage temperature range Sperrspannung Reverse voltage Verlustleistung, TA = 25 C Total power dissipation Symbol Symbol Wert Value - 40 ... + 85 20 150 Einheit Unit C V mW
Top; Tstg VR Ptot
Kennwerte (TA = 25 C, Normlicht A, T = 2856 K) Characteristics (TA = 25 C, standard light A, T = 2856 K) Bezeichnung Description Fotoempfindlichkeit VR = 5 V Spectral sensitivity Wellenlange der max. Fotoempfindlichkeit Wavelength of max. sensitivity Spektraler Bereich der Fotoempfindlichkeit S = 10 % von Smax Spectral range of sensitivity S = 10 % of Smax Bestrahlungsempfindliche Flache Radiant sensitive area Abmessung der bestrahlungsempfindlichen Flache Dimensions of radiant sensitive area Abstand Chipoberflache zu Gehauseoberflache Distance chip front to case surface Halbwinkel Half angle Dunkelstrom, VR = 10 V Dark current Spektrale Fotoempfindlichkeit, = 850 nm Spectral sensitivity Quantenausbeute, = 850 nm Quantum yield Symbol Symbol Wert Value 55 ( 40) 850 400 ... 1100 Einheit Unit nA/lx nm nm
S
S max
A LxB LxW H
4.84 2.20 x 2.20
mm2 mm x mm
0.3
mm
60 2 ( 30) 0.62 0.90
Grad deg. nA A/W Electrons Photon
IR S
Semiconductor Group
2
1997-11-19
BP 104 S
Kennwerte (TA = 25 C, Normlicht A, T = 2856 K) Characteristics (TA = 25 C, standard light A, T = 2856 K) (cont'd) Bezeichnung Description Leerlaufspannung, EV = 1000 lx Open-circuit voltage Kurzschlustrom, EV = 1000 lx Short-circuit current Anstiegs- und Abfallzeit des Fotostromes Rise and fall time of the photocurrent RL = 50 ; VR = 5 V; = 850 nm; Ip = 800 A Durchlaspannung, IF = 100 mA, E = 0 Forward voltage Kapazitat, VR = 0 V, f = 1 MHz, E = 0 Capacitance Temperaturkoeffizient von VO Temperature coefficient of VO Temperaturkoeffizient von ISC Temperature coefficient of ISC Rauschaquivalente Strahlungsleistung Noise equivalent power VR = 10 V, = 850 nm Nachweisgrenze, VR = 10 V, = 850 nm Detection limit Symbol Symbol Wert Value 360 ( 280) 50 20 Einheit Unit mV A ns
VO ISC tr, tf
VF C0 TKV TKI NEP
1.3 48 - 2.6 0.18 3.6 x 10- 14
V pF mV/K %/K W Hz cm * Hz W
D*
6.1 x 1012
Semiconductor Group
3
1997-11-19
BP 104 S
Relative spectral sensitivity Srel = f ()
100
OHF00078
Photocurrent IP = f (Ev), VR = 5 V Open-circuit voltage VO = f (Ev)
P
10 3 A
OHF02283
Total power dissipation Ptot = f (TA)
10 4 mV
S rel %
80
V
10 3
160 mW Ptot 140 120 100
OHF00958
10 2
VO
60
10 1
40
P
10 2
80 60
10 0
20
10 1
40 20
0 400 500 600 700 800 900 nm 1100
10 -1 10 0
10 1
10 2
10 0 10 3 lx 10 4 EV
0
0
20
40
60
80 C 100 TA
Dark current IR = f (VR), E = 0
10 2 nA
OHF02284
Capacitance C = f (VR), f = 1 MHz, E = 0
60
OHF01778
Dark current IR = f (TA), VR = 10 V, E = 0
10 3
OHF00082
C
pF 50
R nA
10 2
R
10
1
40 10 1
30
10 0
20 10 0 10 10 -1
10 -1
0
2
4
6
8 10 12 14 16 V 20
0 -2 10
10 -1
10 0
VR
10 1 V 10 2 VR
0
20
40
60
80 C 100 TA
Directional characteristics Srel = f ()
40 30 20 10
0 1.0
OHF01402
50 0.8 60
0.6
70
0.4
80
0.2 0
90
100
1.0
0.8
0.6
0.4
0
20
40
60
80
100
120
Semiconductor Group
4
1997-11-19


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